Scanning Electron Microscopy Basics

This lecture introduces the basics of Scanning Electron Microscopy (SEM), covering the instrument's working principle, advantages of fast electrons over visible light, and the generation of SEM images. It explains the signals produced by SEM, the impact of beam energy on penetration depth, and the challenges such as beam damage, contamination, and charging. The lecture also discusses the importance of detector position, edge effects, and the role of different detectors in image formation. Various examples and visual aids are used to illustrate key concepts.