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Delves into the non-ideality of op-amps and various noise sources in low-voltage measurements, offering insights into practical implications and strategies for mitigation.
Explores different types of noise in electronic circuits and devices, discussing their impact and methods to model and calculate noise power spectral density.
Delves into circuit innovations reshaping the future, surpassing believed limitations with recent designs of high-power-density DC-DC converters, noise-efficient sensor interfaces, and wide-bandwidth phase-locked loops.
Explores low-power design optimization in MOSFET transistors, focusing on inversion coefficients and transconductance efficiency for maximum performance.
Covers characteristics of a measurement system, including noise reduction and static & dynamic characteristics, with examples of error calculations for pressure sensors.