Lecture
This lecture covers the fundamentals and applications of scanning probe microscopy (SPM), including the different types of microscopes, near-field versus far-field microscopes, surface profiling history, surface reconstruction, quantum mechanical tunneling, STM setup, topography versus work-function in STM, improvement of STM imaging, modern STM instruments, tips in STM, examples of STM images, applications and limits of STM, scanning force microscopy, cantilever as force transducer, and the basic scheme of a scanning force microscope.