Lecture

Scanning Probe Microscopy: AFM Basics

In course

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Description

This lecture introduces scanning probe microscopy, focusing on the Atomic Force Microscope (AFM). It covers the types of microscopes, far-field versus near-field microscopes, different kinds of scanning probe microscopes, the basic scheme of a Scanning Force Microscope, the cantilever as a force transducer, forces in AFM, force-distance curves, capillary forces, and contact mode SFM/AFM.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_6l51x9xd

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