Lectures related to Combinational and Sequential ATPG

Introduces SCOAP measures for testability analysis in VLSI systems, covering controllability, observability, and test vector length prediction.

Explores the significance of power and energy in VLSI design, covering topics like power reduction, energy efficiency, and voltage scaling.

Covers the operation of SRAM, focusing on peripherals and noise margin.

Covers Advanced VLSI Design concepts, including Full Custom Design and Parallel Prefix Adder.

Covers fault collapsing in VLSI systems to reduce redundancy and improve fault detection.