Testability Analysis: SCOAP Measures

This lecture covers the importance of testability analysis in VLSI systems, introducing the SCOAP measures for controllability and observability. It explains the algorithm steps for measuring controllability and observability in combinational and sequential circuits, providing detailed examples and rules. The lecture also discusses the challenges of reconvergent signals and the impact of flip-flops on testability analysis. Additionally, it explores the prediction of test vector length and detailed combinational examples for levelization and observability calculations.