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Transmission electron microscopy
This lecture covers the application of transmission electron microscopy (TEM) in the analysis of dislocations, focusing on 3D reconstruction techniques, chemical analysis, and image processing. Topics include dislocation visualization, tomography, CNN-based reconstruction, synthetic dataset simulations, and spectral analysis. The instructor presents case studies on mineral assemblages, PCA decomposition for phase contrast, and NMF for spectral analysis. The lecture also discusses the challenges of self-absorption effects, detector efficiency, and creating artificial datasets for TEM analysis.