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Lecture
CMOS Camera Trends: Technical Aspects and Innovations
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Related lectures (32)
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CCD Cameras: Dark Current and Noise Analysis
Covers noise sources in CCD cameras, focusing on dark current and its impact on performance.
Optical Detection: Binning Techniques in CCDs
Covers binning techniques in optical detection using charge-coupled devices to reduce image resolution while maintaining signal integrity.
CMOS Cameras: Shutter Mechanisms and Noise Sources
Covers the rolling shutter effect and noise sources in CMOS cameras, highlighting solutions for image deformation and the advantages of pinned photodiodes.
CCD Cameras: Electronics and Charge Conversion
Discusses the electronics of CCD cameras, focusing on output amplifiers and charge conversion processes.
Charge Collection in CCD Cameras: Mechanisms and Applications
Explains charge collection mechanisms in CCD cameras, focusing on photogates and the impact of illumination methods on quantum efficiency.
Noise in CCD Cameras: Reset and Readout Mechanisms
Covers noise sources in CCD cameras, focusing on reset noise, readout noise, and methods for noise suppression like correlated double sampling.
Correlated Double Sampling: In-Pixel Solutions
Covers the integration of correlated double sampling within pixel structures of CMOS image sensors.
Optical Image Sensors: Noise Suppression and Measurement
Explores noise suppression, sensor measurement, dynamic range, microlenses, and single-photon detectors in optical image sensors.
Optical Detection: Correlated Double Sampling in 5T APS
Covers the design and operation of a 5T RPS pixel for correlated double sampling in optical detection systems.
Image Processing Fundamentals
Covers the basics of image processing for microscopy, including acquiring, correcting defects, enhancing images, and extracting information.