Atomic Force Microscopy: Resolution and SPR Applications

About
Privacy
Disclaimer

Graph Chatbot

In course

DEMO: exercitation et

Consectetur mollit laboris consectetur cillum eiusmod qui labore ut nisi consectetur. Proident non elit amet sint proident elit dolore. Quis aliqua ut laborum nostrud sint ad ex. Aute fugiat excepteur tempor tempor dolore adipisicing elit pariatur aute consequat elit Lorem. Qui ipsum ullamco velit ut nostrud do veniam magna nostrud cillum tempor. Non do dolor Lorem consequat cillum do Lorem.

Description

This lecture covers the calculation of the maximum resolution in Atomic Force Microscopy (AFM) when using hemispherical tips of different radii and tilting angles. It also discusses the estimation of the thickness of a metal slice in Surface Plasmon Resonance (SPR) experiments to diminish the evanescent wave intensity. Additionally, it presents a practical SPR experiment for antigen detection, including sensor functionalization, flux variations, and data interpretation.

Instructor

labore irure

Non eu excepteur qui deserunt. Consequat dolore ad aute commodo ea eu laboris sint adipisicing nulla. Id sunt minim exercitation pariatur culpa consequat aliqua id id. Adipisicing dolore fugiat qui et eiusmod labore.

Official source

Related lectures (20)

https://mediaspace.epfl.ch/media/0_am449pcd

About this result

This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

In course

DEMO: exercitation et

Instructor

labore irure

Related lectures (20)

NMR and SPR: Spectroscopy and Resonance

Explores NMR spectroscopy energy splitting and resonance, along with SPR principles and applications in biosensing.

Coherent Control of Plasma Resonances

Explores wavefunction engineering, coherence control, speckle phenomena, microscopy, dynamics, and plasma resonances.

Checking Probes-layer quality

Covers quality assessment of probes-layers using Resonant Mirror, Surface Plasmon Resonance, and Scanning Electron Microscopy.

Exploring 2D Materials at High Resolution

Explores advanced electron microscopy techniques for 2D materials, covering high-resolution imaging, reducing damage, diffraction, and ptychography.

Metal Nanoshells: Tunable Optical Response

Explores metal nanoshells with tunable optical responses for biomedical and energy applications.