Atomic Force Microscopy: Resolution and SPR Applications

In course

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Description

This lecture covers the calculation of the maximum resolution in Atomic Force Microscopy (AFM) when using hemispherical tips of different radii and tilting angles. It also discusses the estimation of the thickness of a metal slice in Surface Plasmon Resonance (SPR) experiments to diminish the evanescent wave intensity. Additionally, it presents a practical SPR experiment for antigen detection, including sensor functionalization, flux variations, and data interpretation.

Instructor

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Official source

https://mediaspace.epfl.ch/media/0_am449pcd

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Ontological neighbourhood

Electrical engineering

Photonics: Topics in photonics

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