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This lecture provides an overview of electron microscopy, covering the historical development, components of an electron microscope, types of electron microscopes, and the principles behind electron lenses. It discusses the importance of vacuum levels, electron sources, lenses, and detectors in electron microscopy. The lecture also delves into the concepts of magnification, resolution, and the interaction of electrons with matter. Various types of electron microscopes, such as SEM and TEM, are explored, along with their signals and applications. Additionally, the lecture touches upon the challenges of lens aberrations and the methods to correct them, including astigmatism and spherical aberration.