Lecture

Microscopic Analyses & Electron Sources

In course

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Description

This lecture provides an overview of microscopic analyses using optical and electron microscopy. It covers the lateral resolution, different microscopy types, such as optical, electron, and scanning probe microscopy, and their applications in structural and surface analysis. The lecture also delves into electron sources, including electron guns, condensers, and their impact on beam diameter and brightness in electron microscopy.

Instructor

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Official source

https://mediaspace.epfl.ch/media/0_mqkk29zf

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Ontological neighbourhood

Physics

Optics: Geometrical optics

Industrial and production engineering

Manufacturing engineering: Electron-beam technology

Mathematics

Geometry: Differential geometry

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