Plasma Heating: Electron vs Ion

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Focused Ion Beam: Principles and Applications

Explores the principles and applications of Focused Ion Beam technology, including ion-solid interactions, ion milling, and nanofabrication.

TEM Lenses: Condenser, Objective, and Projector

Explores the roles of condenser, objective, and projector lenses in a TEM.

Electron Microscopy: TEM

Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.

Transmission Electron Microscopy

Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.

High Resolution TEM: Imaging and Contrast

Explores High Resolution TEM principles for atomic-level crystal imaging.

Dynamical Scattering: Bend Contours

Explains the dynamical scattering effect of bend contours in TEM images of crystalline samples.

Dose Management in Electron Microscopy

Explores the challenges and solutions for managing electron dose in microscopy, emphasizing the importance of accurate dose tracking and analysis.

High Resolution He Ion Microscopy

Covers the ALIS He ion source and its application in high resolution microscopy, providing remarkable surface detail and material contrast.

Magnetohydrodynamic Equilibrium Configurations

Covers MHD equilibrium configurations, including tokamak and stellarator concepts, force balance equations, and safety factors.

Electron Microscopy: In Situ

Explores electron microscopy in situ, including time-resolved techniques and environmental TEM applications.