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Lecture# Electron Microscopy: EDS

Description

This lecture covers the principles and applications of Energy-Dispersive X-ray Spectroscopy (EDS) in electron microscopy. Topics include x-ray generation, detection, quantification, and mapping of elements in samples. The lecture also discusses corrections for absorption, reabsorption, and quantification errors, as well as the importance of sample homogeneity and acquisition conditions for accurate results.

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Related concepts (62)

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Related lectures (12)

In course

Scanning electron microscope

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image.

Universal quantification

In mathematical logic, a universal quantification is a type of quantifier, a logical constant which is interpreted as "given any", "for all", or "for any". It expresses that a predicate can be satisfied by every member of a domain of discourse. In other words, it is the predication of a property or relation to every member of the domain. It asserts that a predicate within the scope of a universal quantifier is true of every value of a predicate variable.

Existential quantification

In predicate logic, an existential quantification is a type of quantifier, a logical constant which is interpreted as "there exists", "there is at least one", or "for some". It is usually denoted by the logical operator symbol ∃, which, when used together with a predicate variable, is called an existential quantifier ("∃x" or "∃(x)" or "(∃x)"). Existential quantification is distinct from universal quantification ("for all"), which asserts that the property or relation holds for all members of the domain.

Branching quantifier

In logic a branching quantifier, also called a Henkin quantifier, finite partially ordered quantifier or even nonlinear quantifier, is a partial ordering of quantifiers for Q ∈ {∀,∃}. It is a special case of generalized quantifier. In classical logic, quantifier prefixes are linearly ordered such that the value of a variable ym bound by a quantifier Qm depends on the value of the variables y1, ..., ym−1 bound by quantifiers Qy1, ..., Qym−1 preceding Qm. In a logic with (finite) partially ordered quantification this is not in general the case.

X-ray detector

X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photographic film), now mostly replaced by various digitizing devices like s or flat panel detectors) and dose measurement devices (such as ionization chambers, Geiger counters, and dosimeters used to measure the local radiation exposure, dose, and/or dose rate, for example, for verifying that radiation protection equipment and procedures are effective on an ongoing basis).

MSE-352: Introduction to microscopy + Laboratory work

Ce cours d'introduction à la microscopie a pour but de donner un apperçu des différentes techniques d'analyse de la microstructure et de la composition des matériaux, en particulier celles liées aux m

Beam-Matter Interactions

Explores beam-matter interactions, thermal effects, chemical effects, atomic displacements, and matter emission mechanisms in electron microscopy.

Scanning Electron Microscopy: Fundamentals and Applications

Covers the fundamentals of scanning electron microscopy, including electron matter interaction, imaging techniques, and related advanced topics.

Electron Microscopy Components

Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.

Advanced TEM Operation

Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.

X-ray Magnetic Imaging Techniques

Covers x-ray magnetic imaging techniques, including XMCD, XRMS, and x-ray optics, for studying magnetic materials and domains.