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Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explores self-sensing cantilevers in Scanning Probe Microscopy and the advantages of integrated sensor-actuator systems for high-speed data collection.
Delves into nanoscale properties, emphasizing surface effects and quantum phenomena, exploring electronic, mechanical, magnetic, photonic, and chemical properties unique to the nanoscale.
Explores the engineering of intrinsic π-electron magnetism in carbon nanostructures, focusing on inducing magnetism in graphene and nanographenes through sublattice imbalance and topological frustration.
Explores magnetism, magnetic sources, fields, domains, hysteresis, energy contributions, types of magnetism, and nanoscale magnetic structure investigation.
