Explores the fundamentals and applications of scanning probe microscopy, including STM setup, surface reconstruction, quantum tunneling, and scanning force microscopy.
Covers the principles and applications of Atomic Force Microscopy (AFM) for nanoscale metrology, including imaging modes, tip-sample interactions, and image processing.
Explores the forces, tips, and probes used in Scanning Probe Microscopy, focusing on AFM principles, tip resolution limits, and cantilever probe fabrication.
Explores nanoparticle fabrication methods, challenges in carbon nanotube and nanowire production, and the comparison of bottom-up and top-down approaches.
Reviews ultrafast carrier and spin dynamics in 2D semiconductors and their heterostructures, exploring unique optical responses and novel applications.
