Atomic Force Microscopy: Nanoscale Metrology

This lecture covers the principles and applications of Atomic Force Microscopy (AFM), a versatile tool for nanoscale measurements. Topics include AFM imaging modes, the AFM cantilever, resolution, force curves, feedback mechanisms, and various scanning probe modes. The instructor discusses the challenges of measuring small objects due to the diffraction limit and the importance of feedback in maintaining constant tip/sample interaction. Additionally, the lecture explores the fabrication of nanoscale building blocks for creating useful devices and the different forces acting between the tip and sample. Various AFM imaging techniques such as amplitude modulation and phase imaging are also explained, along with the significance of cantilever dynamics and tip artefacts.