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Explores Transmission Electron Microscopy (TEM) principles, contrast mechanisms, dislocation identification, and sample cleaning methods for accurate imaging.
Focuses on breaking interoperability barriers in AEC software through open-source connectors, showcasing the integration of BIM models within immersive 3D environments.
Explores electron microscopy techniques for polymer morphological characterization, covering contrast sources, beam damage, and strategies to avoid damage.
Explores 3D Microscopy and Tomography techniques, including Atom Probe Tomography and Field Emission Microscopy, emphasizing electron tomography principles and applications.
