Covers advanced operation techniques for a Transmission Electron Microscope (TEM), including setting up the workset and fine-tuning the image.
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Explores the components and operation of Transmission Electron Microscopy, covering vacuum systems, electron emission, lens aberrations, and detector types.
Explores Transmission Electron Microscopy (TEM), covering diffraction patterns, image formation, and contrast mechanisms.
Covers fundamental principles of ray and wave optics, including reflection, interference, diffraction, and spectroscopy.
