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Responding to Feedback
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Related lectures (32)
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Student Evaluation of Teaching: Importance and Strategies
Explores the importance of student feedback on teaching and strategies for effective evaluations.
Framework to Assess Teaching Experience
Presents a framework for teachers to reflect on their teaching experience and discusses Brookfield's Model of Reflection.
Polarized Light: Reflection and Lenses
Explores circular polarized waves, reflection, lenses, and human vision optics.
Focusing Thermal Sources: Gaussian Beams
Explores the transformation of spherical waves into converging ones using lenses and discusses Gaussian beams' properties and focusing of thermal sources.
Electron Microscopy Components
Covers electron microscope components, vacuum systems, aberrations, detectors, and specimen holders.
Microscopy and Imaging Systems
Covers the fundamental concepts of microscopy, explaining the need for magnification beyond the human eye and introducing advanced imaging techniques.
Electron Microscope Components
Covers the components and technologies used in electron microscopy, including detectors, lenses, aberrations, and specimen holders.
Image Formation: Lens and Mirror System
Covers the formation of images by lens and mirror systems.
Stress-based Frequency Tuning
Explores stress-based frequency tuning in micro/nanomechanical devices, covering black body radiation, optical nonlinearity, NETD, and dynamic range.
Student Feedback: Managing Emotions and Reflective Strategies
Explores Brookfield's Model of Reflection and strategies for managing student feedback.
