Introduction to Metrology

This lecture introduces the field of metrology, focusing on nanoscale measurements and instrumentation. It covers the scale of nanometers, different units of measurement, optical microscopy, atomic force microscopy, electron microscopy, and the International System of Units. The instructor explains the importance of defining units based on physical phenomena, artefacts, and universally true constants, highlighting the recent redefinition of the kilogram. The lecture also discusses dimensional analysis and provides exercises on the redefinition of units. Throughout the slides, various examples and comparisons are used to illustrate the challenges and advancements in metrology.