MICRO-428: Metrology

Summary

The course deals with the concept of measuring in different domains, particularly in the electrical, optical, and microscale domains. The course will end with a perspective on quantum measurements, which could trigger the ultimate revolution in metrology.

Official source

https://edu.epfl.ch/coursebook/en/metrology-MICRO-428

Moodle Page

http://go.epfl.ch/MICRO-428

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Instructors (3)

Lectures in this course (41)

Related concepts (700)

Related courses (208)

Related MOOCs (76)

Edoardo Charbon

Edoardo Charbon (SM’00 F’17) received the Elektrotechnik Diploma from ETH Zurich, the M.S. from the University of California at San Diego, and the Ph.D. from the University of California at Berkeley in 1988, 1991, and 1995, respectively, all in electrical engineering and EECS. He has consulted with numerous organizations, including Bosch, X-Fab, Texas Instruments, Maxim, Sony, Agilent, and the Carlyle Group. He was with Cadence Design Systems from 1995 to 2000, where he was the architect of the company's initiative on information hiding for intellectual property protection. In 2000, he joined Canesta Inc., as the Chief Architect, where he led the development of wireless 3-D CMOS image sensors. Since 2002 he has been a member of the faculty of EPFL, where is a full professor since 2015. From 2008 to 2016 he was full professor and chair at the Delft University of Technology, where he spearheaded the university's effort on cryogenic electronics for quantum computing as part of QuTech. He has been the driving force behind the creation of deep-submicron CMOS SPAD technology, which is mass-produced since 2015 and is present in smartphones, telemeters, proximity sensors, and medical diagnostics tools. His interests span from 3-D vision, LiDAR, FLIM, FCS, NIROT to super-resolution microscopy, time-resolved Raman spectroscopy, and cryo-CMOS circuits and systems for quantum computing. He has authored or co-authored over 400 papers and two books, and he holds 23 patents. Dr. Charbon is a distinguished visiting scholar of the W. M. Keck Institute for Space at Caltech, a fellow of the Kavli Institute of Nanoscience Delft, a distinguished lecturer of the IEEE Photonics Society, and a fellow of the IEEE.

Claudio Bruschini

Claudio Bruschini holds an MSc in high energy physics from the University of Genova and a PhD in Applied Sciences from the Vrije Universiteit Brussel (VUB). He started his career with INFN (Italy, 1993), in the WA92 CERN collaboration (particle physics), and then moved to CERN as a Fellow in the European GP-MIMD2 project, attached to the NA48 collaboration (particle physics, parallel programming, 1994-1995). He then started his close collaboration with EPFL, first in the DeTeC (Demining Technology Center) project (sensors for landmine detection/humanitarian demining, 1996-1997). After DeTeC's end, he started the first of a series of fruitful collaborations with the Vrije Universiteit Brussel (VUB) on humanitarian demining related R&D (1998). This was followed by the EUDEM survey project (The European Union in Humanitarian Demining, 1998), the EUDEM2 three year EC sponsored support measure (www.eudem.info, 2001-2004), and the DELVE support action (www.delve.vub.ac.be, 2007). In parallel he started working within the EPFL's AQUA group (Advanced Quantum Architectures, Edoardo Charbon), on topics as diverse as ultrasonic sensors for in-air application, optical 3D and high speed 2D sensing, sensor networks, or tracking/motion capture systems, in particular for the preparation of research projects. This culminated in the European MEGAFRAME (www.megaframe.eu, FP6, 2006-2010, SPAD arrays and related in-pixel time stamping electronics in deep submicron CMOS technology) and SPADnet (www.spadnet.eu, FP7, 2010-2014, networked SPAD arrays for Positron Emission Tomography) projects, coordinated by EPFL-AQUA. As from 2009 he also worked with Dario Floreano on the management of the CURVACE Curved Artificial Compound Eyes FP7 project (www.curvace.org), coordinated by EPFL-LIS. He was also active with CHUV (Lausanne University Hospital) within EndoTOFPET-US (endoscopic PET) as well as on a CTI project devoted to the development of a new hand-held standalone tool for tracer-guided medical procedures. In 2014 he had also the pleasure of joining the EPFL ICLAB of Christian Enz during its ramp-up phase, collaborating on device related topics (SNF GigaRadMOST) and biomedical R&D (NanoTera WiseSkin). Claudio is now fully with EPFL’s Advanced Quantum Architecture (AQUA). He has also been active as independent scientific consultant, under the label CBR Scientific Consulting, on the preparation of (European) R&D project proposals and the execution of individual studies, and worked in 2006 for a local start-up as operations manager and R&D advisor.... but this is another story. An unauthorized early biography is available at http://lami.epfl.ch/team/claudiob/...

Georg Fantner

Statistics

Statistics (from German: Statistik, () "description of a state, a country") is the discipline that concerns the collection, organization, analysis, interpretation, and presentation of data. In applying statistics to a scientific, industrial, or social problem, it is conventional to begin with a statistical population or a statistical model to be studied. Populations can be diverse groups of people or objects such as "all people living in a country" or "every atom composing a crystal".

Active-pixel sensor

An active-pixel sensor (APS) is an , which was invented by Peter J.W. Noble in 1968, where each pixel sensor unit cell has a photodetector (typically a pinned photodiode) and one or more active transistors. In a metal–oxide–semiconductor (MOS) active-pixel sensor, MOS field-effect transistors (MOSFETs) are used as amplifiers. There are different types of APS, including the early NMOS APS and the now much more common complementary MOS (CMOS) APS, also known as the CMOS sensor.

Image sensor

An image sensor or imager is a sensor that detects and conveys information used to form an . It does so by converting the variable attenuation of light waves (as they pass through or reflect off objects) into signals, small bursts of current that convey the information. The waves can be light or other electromagnetic radiation. Image sensors are used in electronic imaging devices of both analog and digital types, which include digital cameras, camera modules, camera phones, optical mouse devices, medical imaging equipment, night vision equipment such as thermal imaging devices, radar, sonar, and others.

Noise (electronics)

In electronics, noise is an unwanted disturbance in an electrical signal. Noise generated by electronic devices varies greatly as it is produced by several different effects. In particular, noise is inherent in physics and central to thermodynamics. Any conductor with electrical resistance will generate thermal noise inherently. The final elimination of thermal noise in electronics can only be achieved cryogenically, and even then quantum noise would remain inherent. Electronic noise is a common component of noise in signal processing.

Summary statistics

In descriptive statistics, summary statistics are used to summarize a set of observations, in order to communicate the largest amount of information as simply as possible. Statisticians commonly try to describe the observations in a measure of location, or central tendency, such as the arithmetic mean a measure of statistical dispersion like the standard mean absolute deviation a measure of the shape of the distribution like skewness or kurtosis if more than one variable is measured, a measure of statistical dependence such as a correlation coefficient A common collection of order statistics used as summary statistics are the five-number summary, sometimes extended to a seven-number summary, and the associated box plot.