Electron Microscopy: TEM

This lecture covers the principles of transmission electron microscopy (TEM), including the components of the TEM setup such as electron gun, condenser, projector, and camera. It explains how lenses focus electrons to produce images and diffraction patterns, and how diffraction patterns are used to index crystals. The lecture also discusses the importance of parallel illumination and the use of lenses to achieve this. Practical aspects of TEM, such as sample thickness and diffraction pattern indexing, are also addressed.