Lectures related to Interferometry: Mark Zander System

Explores thin film interference using Si3N4 on glass for electrical insulation.

Covers the properties of circularly polarized light and refraction phenomena.

Explores reflection and refraction at dielectrics and the application of boundary conditions.

Explores electromagnetic properties, refractive index, negative refraction, and the concept of a perfect lens for high-resolution imaging.

Covers the principles of electromagnetic waves, including wave interference and diffraction.

Delves into nanostructures, phase engineering, anomalous reflection, negative refraction, and optical simulations.

Explains how to calculate the thickness of a silicon nitride layer using synfilm interference and optical path difference.

Covers the focal distance and size of an object in a spherical lens.