Fault Simulation and Testability Analysis

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Description

This lecture covers fault simulation in VLSI systems, focusing on fault list generation, fault dropping, and fault sampling. It also discusses algorithms for fault simulation, types of fault simulators, and the differences between serial and parallel fault simulation methods. Additionally, it delves into testability analysis, explaining controllability and observability measures, and the SCOAP algorithm. The lecture concludes with examples of combinational and sequential measures, as well as detailed explanations of controllability and observability rules.

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https://mediaspace.epfl.ch/media/0_dsvirzf1

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