Testability Analysis: SCOAP Measures

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Introduces digital circuits, covering binary systems, logic operators, Boolean algebra, memory elements, and practical examples like BCD decoders and shift registers.

Logic Gates and Hazard Elimination

Explores logic gates, hazard elimination, ALUs, counters, and shift registers in semiconductor technology.

Test of VLSI Systems: Combinational and Sequential ATPG

Covers the generation of test vector patterns, fault modeling, structural vs. functional tests, and the implementation of time-frame expansion.

Quantum Computing Fundamentals

Covers quantum computing fundamentals, ADC architectures, oversampling advantages, noise shaping, glitch phenomena, and digital integrated circuit noise.

Fault Simulation and Testability Analysis

Covers fault simulation, testability analysis, and fault list generation in VLSI systems.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits from functional descriptions and truth tables.

Logic Synthesis: Designing Efficient Digital Circuits

Discusses logic synthesis techniques for designing efficient digital circuits using minterms, maxterms, and new gates like XOR and XNOR.

Logical Effort: Fundamentals of VLSI Design

Covers the Logical Effort method for optimizing logic delay and gate sizing impact.

Logic Systems: Technology Overview

Provides an overview of the technology behind logic gates, covering TTL and CMOS families and addressing static and dynamic hazards, gated clocks, and switch debouncing.

Digital Logic Circuits: CMOS and Verilog Design

Discusses digital logic circuits, CMOS technology, and Verilog for circuit design.