Atomic Force Microscopy: Polymer Morphology

This lecture covers the principles and techniques of Atomic Force Microscopy (AFM) for characterizing polymer morphology. It explains the different modes of AFM operation, such as contact, non-contact, and intermittent contact modes, and their applications in studying specimen-tip interactions. The lecture also discusses the components of an AFM setup, including the cantilever, tip, and feedback loop system. Special attention is given to the AFM tip design and its importance in achieving high-resolution imaging. Various specimen-tip interactions, such as short-range repulsive forces and capillary forces, are explored. The lecture concludes with examples of AFM imaging in different modes and the challenges associated with contact mode imaging.