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Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Explores the historical perspective, properties, and applications of X-rays, including diffraction, atomic resolution, and spectral colors of elements.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
