Ultrafast Lorentz Transmission Electron Microscopy
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Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Explores sample preparation techniques for TEM, such as cleaved wedge method and ultramicrotomy, highlighting their importance in obtaining high-quality samples.
Explores ptychography for imaging atoms and fields at picometer scale, covering resolution limits, depth sectioning, Lorentz microscopy, and detector advancements.
Covers the historical development and key components of Transmission Electron Microscopy, including electron gun, lenses, apertures, and specimen holders.
Covers the basics of the reciprocal lattice in electron diffraction, including diffraction vector geometry and properties of reciprocal lattice unit cell vectors.
