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Covers the principles and applications of Transmission Electron Microscopy, including imaging, diffraction, contrast mechanisms, and in situ techniques.
Explores coherence and interferometry principles, including statistical optics, autocorrelation functions, and optical coherence tomography applications.
Explores HRTEM image formation through interference of transmitted and diffracted beams, covering contrast transfer function, aberration correction, and phase retrieval techniques.
Covers the basic principles of laser operation, types of laser systems, noise characteristics, optical fibers, ultrafast lasers, and modern applications.
Explores the principles of Scanning Transmission Electron Microscopy (STEM) for analytical microscopy, covering TEM diffraction, detectors, and EDS analysis.
