Lecture
This lecture delves into advanced techniques for polymer morphological characterization using Atomic Force Microscopy (AFM). It covers topics such as non-contact mode imaging, interaction forces, resonant frequency of the cantilever, and the challenges of maintaining a constant distance between the tip and the specimen. The lecture also explores the use of AFM in different tapping modes, the impact of specimen properties on phase shift, and the complexities of interpreting phase images. Additionally, it discusses the energy dissipation sources, realistic models for phase contrast, and the significance of phase-distance curves in Intermittent Contact AFM. The lecture concludes with examples of sharpened tips and the limitations and advantages of AFM in polymer characterization.