Explores bug-finding, verification, and the use of learning-aided approaches in program reasoning, showcasing examples like the Heartbleed bug and differential Bayesian reasoning.
Explores dependability in industrial automation, covering reliability, safety, fault characteristics, and examples of failure sources in various industries.
Covers the principles of Scanning Electron Microscopy, including SEM signals, detectors, and energy spectrum of electrons, as well as the efficiency of X-ray generation.
