Semiconductor Devices II: Contact Resistance Modeling

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Semiconductor Devices II: Defects Engineering

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

Semiconductor Devices II: CV Modelling

Covers defect probing, 2D material defects, CV measurements, defect modelling, and experimental data analysis.

Density of States in Semiconductor Devices

Explores density of states in semiconductor devices, covering electron gas, energy bands, Fermi-Dirac distribution, and band structures.

Simulation of 2D Field Effect Transistors

Covers the simulation of 2D Field Effect Transistors and the advantages of using Green's Function.

Defects in 2D Materials

Explores common defects in 2D materials, their impact on device performance, and strategies for defect healing and positive applications.

Semiconductors: Band Structure and Carrier Concentration

Explains band structure, density of states, Fermi distribution, and carrier densities.

Strain and Heteroepitaxy

Explores the impact of strain on semiconductor band structures, epitaxy, critical thickness, and defect formation, emphasizing the role of Hooke's law and elasticity theory.

Intrinsic Semiconductors: Thermal Generation and Carrier Concentration

Covers intrinsic semiconductors, focusing on thermal generation and carrier concentration calculations.

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Excitonic Devices: Modeling and Applications

Covers excitonic device modeling and exciton control using 2D materials.