Semiconductor Devices II: CV Modelling

Covers the analysis of measurements and defects engineering in semiconductor devices, including density of states and defect probing.

Explores contact resistance modeling in semiconductor devices, focusing on gate voltage calculation and defect analysis.

Explores density of states in semiconductor devices, covering electron gas, energy bands, Fermi-Dirac distribution, and band structures.

Explores the profiling and behavior of ion channels, including their diversity and classes.

Covers the simulation of 2D Field Effect Transistors and the advantages of using Green's Function.