Lecture

Semiconductor Devices II: Defects Engineering

In course

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Description

This lecture covers the analysis of measurements and defects engineering in semiconductor devices. Topics include density of states, defect probing by CV measurements, defects on 2D materials, and modeling of defect DOS. Practical examples and experimental data analysis are also discussed.

Instructors (2)

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Official source

https://mediaspace.epfl.ch/media/0_91zpbcvv

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Ontological neighbourhood

Physics

Condensed matter physics: Solid-state physics

Electromagnetism: Electrical networks, Electrostatics

Theoretical computer science

Programming language theory: High-level programming languages

Computer engineering

Hardware engineering: Microprocessors

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