Exploring 2D Materials at High Resolution

This lecture delves into the exploration of 2D materials using advanced electron microscopy techniques, focusing on high-resolution imaging, reducing damage in TEM, electron diffraction, 4D-STEM, and ptychography. It covers topics such as electron microscopes, measures to reduce damage in TEM, electron diffraction at low kV, 4D-STEM in the SEM, orientation mapping of materials, and phase & orientation mapping. The lecture also discusses the preparation of the microscope room, hybrid pixel detectors for EELS and electron diffraction, dynamic range considerations, and applications of surface plasmons. Furthermore, it explores live processing of 4D-STEM data, non-rigid registration of data, 3D ptychography, and multislice ptychography, providing insights into various experimental models and theoretical simulations.