Lecture

Atomic Force Microscope: Imaging and Modes

Description

This lecture covers the operation of the Atomic Force Microscope (AFM) for imaging insulating surfaces at the atomic scale, explaining the force interactions between the cantilever and the sample in contact and non-contact modes. It also discusses the optical detection of cantilever deflection and the differences between AFM and Magnetic Force Microscope (MFM) in imaging magnetized domains.

About this result
This page is automatically generated and may contain information that is not correct, complete, up-to-date, or relevant to your search query. The same applies to every other page on this website. Please make sure to verify the information with EPFL's official sources.

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.