Lecture

Atomic Force Microscope: Imaging and Modes

Description

This lecture covers the operation of the Atomic Force Microscope (AFM) for imaging insulating surfaces at the atomic scale, explaining the force interactions between the cantilever and the sample in contact and non-contact modes. It also discusses the optical detection of cantilever deflection and the differences between AFM and Magnetic Force Microscope (MFM) in imaging magnetized domains.

Instructors (4)

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Official source

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Ontological neighbourhood

Physics

Condensed matter physics: Phase transitions

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