Covers the basics of transmission electron microscopy, including components, operation, imaging modes, diffraction analysis, and the interaction of high-energy electrons with matter.
Introduces dynamical scattering in TEM, covering single and multiple elastic scattering, 2-beam diffraction, Bloch wave theory, and scattering intensity.
Covers high-resolution transmission electron microscopy imaging techniques, focusing on phase contrast, simulations, and the impact of aberrations on image interpretation.
Introduces the basics of transmission electron microscopy, covering electron diffraction, imaging modes, specimen preparation, electron properties, and high-resolution imaging.
