Environmental SEM: Imaging and Analysis

In course

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Description

This lecture covers the principles and applications of Environmental Scanning Electron Microscopy (ESEM), focusing on imaging samples in various conditions without preparation. Topics include electron beam scanning, pressure manipulation, electron scattering, X-ray analysis, charge suppression, and imaging capabilities. The instructor demonstrates how ESEM allows observation of non-conductive, wet, and dynamic samples, providing insights into phase transitions and hydrated samples.

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Instructor

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Official source

https://mediaspace.epfl.ch/media/0_wc7v3kzu

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