Covers resolution enhancement in optical microscopy, confocal imaging, and fluorescent labelling, exploring the history and techniques of scanning probe microscopy.
Covers X-Ray Micro-Analysis (XRMA) comparing techniques for analyzing matter with electron beams, discussing interaction volume, emission, fluorescence, and matrix effects.
Explores beam-matter interactions, focusing on emission phenomena from core electron ionization by X-Rays and electrons, and the competition between Auger and X-Rays emissions.
Covers the basics of Scanning Electron Microscopy, including electron-sample interactions, detectors, sample preparation, image formation, resolution, and contrasts in SEM images.
