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This lecture delves into the intricacies of high-resolution transmission electron microscopy (HRTEM) for crystal structure imaging. The instructor explains the imaging process, including the use of lenses and the challenges posed by spherical and chromatic aberrations. The lecture covers the importance of defocus values, the impact of lens stability, and the development of CS correctors to overcome aberrations. The instructor also discusses the iterative waveform reconstruction method for obtaining atomic-level images and the significance of zero defocus imaging. The lecture concludes with insights into the advanced microscopy techniques and the annual advanced transmission electron microscopy course at the institute.