Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.
DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.
High defect density exhibited by nanoelectronic technologies, and parameter variability already affecting the operation of very-deep submicron CMOS systems demand for a combination of specific solutions, focusing at each various levels of abstraction in th ...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete tool for ...
An assessment of the fault-tolerance properties of single-ended and differential signaling is shown in the context of a high defect density environment, using a robust error-absorbing circuit architecture. A software tool based on Monte-Carlo simulations i ...
This paper presents a new approach for monitoring and estimating device reliability of nanometer-scale devices prior to fabrication. A four-layer architecture exhibiting a large immunity to permanent as well as random failures is used. A complete Monte Car ...
