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Federico Faccio

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Related publications (13)

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Federico Faccio

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Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs

A Dual-Edge Pulsewidth Modulator for Fast Dynamic Response DC-DC Converters

Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs

Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs

Radiation-Induced Charge Trapping in Shallow Trench Isolations of FinFETs

A Dual-Edge Pulsewidth Modulator for Fast Dynamic Response DC-DC Converters