Publications by Adil Koukab | EPFL Graph Search

Radiation response of 28 nm CMOS transistors at high proton and neutron fluences for high energy physics applications

The 28 nm CMOS technology was selected as a promising candidate to upgrade electronics of particle detectors at CERN. Despite the robustness of this node to ultra-high levels of total ionizing dose has been proven, the resilience to 10161MeVneq/cm2 fluence ...

2024

High-rate, high-resolution single photon X-ray imaging: Medipix4, a large 4-side buttable pixel readout chip with high granularity and spectroscopic capabilities

Jean-Michel Sallese, Adil Koukab, Viros Sriskaran

The Medipix4 chip is the latest member in the Medipix/Timepix family of hybrid pixel detector chips aimed at high -rate spectroscopic X-ray imaging using high -Z materials. It can be tiled on all 4 sides making it ideal for constructing large -area detecto ...

Iop Publishing Ltd2024

Characteristics and ultra-high total ionizing dose response of 22nm fully depleted silicon-on-insulator

Jean-Michel Sallese, Adil Koukab, Gennaro Termo

The radiation response of MOS transistors in a 22 nm Fully Depleted Silicon -On -Insulator (FDSOI) technology exposed to ultra -high total ionizing dose (TID) was investigated. Custom structures including n- and p -channel devices with different sizes and ...

Iop Publishing Ltd2024

Fab-to-fab and run-to-run variability in 130 nm and 65 nm CMOS technologies exposed to ultra-high TID

Jean-Michel Sallese, Adil Koukab, Gennaro Termo, Stefano Michelis

The discovery of a large fab-to-fab variability in the TID response of the CMOS technologies used in the design of ASICs for the particle detectors of the HL-LHC triggered a monitoring effort to verify the consistency of the CMOS production process over ti ...

IOP Publishing Ltd2023

Neutron- and Proton-Induced Degradation of MOS Transistors in 28 nm CMOS Technology (September 2023)

Jean-Michel Sallese, Adil Koukab

The 28 nm CMOS technology was selected as a promising candidate for upgrade of the electronics of particle detectors at CERN. Despite the robustness of this node to ultrahigh levels of total ionizing dose has been proven, the capability to withstand 1016 1 ...

Institute of Electrical and Electronics Engineers Inc.2023

The Timepix4 analog front-end design: Lessons learnt on fundamental limits to noise and time resolution in highly segmented hybrid pixel detectors

Jean-Michel Sallese, Adil Koukab

This manuscript describes the optimization of the front-end readout electronics for high granularity hybrid pixel detectors. The theoretical study aims at minimizing the noise and jitter. The model presented here is validated with both circuit post layout ...

2023

Time-resolved multi-gate ion sensitive field effect transducer and system and method of operating the same

Jean-Michel Sallese, Adil Koukab

A time-resolved multi-gate ion sensitive field effect transducer, including a silicon layer, a P-doped region in the silicon layer and a first electrode in electric connection with the P doped region, a N-doped region in the silicon layer and a second elec ...

2023

New architecture for the analog front-end of Medipix4

Jean-Michel Sallese, Adil Koukab, Viros Sriskaran

The Medipix4 chip is the latest member of the family of Medipix pixel detector readout chips aimed at high rate spectroscopic X-ray imaging. Unlike its predecessors, it will be possible to tile the chip on all 4 sides permitting seamless large area coverag ...

ELSEVIER2020

A Dual-Edge Pulsewidth Modulator for Fast Dynamic Response DC-DC Converters

Maher Kayal, Adil Koukab, Giacomo Ripamonti, Stefano Michelis, Federico Faccio

Voltage regulator modules are dc-dc converters that power modern microprocessors. They must exhibit a fast dynamic response, in order to achieve satisfactory regulation performance in spite of the rapid load current variations. The pulsewidth modulator is ...

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC2019

A Reliability and Efficiency Optimization System for Hard-Switching DC/DC Converters

Maher Kayal, Adil Koukab, Giacomo Ripamonti, Stefano Michelis, Federico Faccio

The Large Hadron Collider experiments at CERN will use power distribution schemes relying on integrated buck DC/DC converters. Due to the radiation-hardness requirements, the devices used for the development of such converters will have a voltage rating wh ...

IEEE2018