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Milos Stanisavljevic

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Related publications (18)

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Milos Stanisavljevic

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Multilevel-Cell Phase-Change Memory: A Viable Technology

Reliability of Nanoscale Circuits and Systems

Output Probability Density Functions of Logic Circuits: Modeling and Fault-Tolerance Evaluation

Selective Redundancy-Based Design Techniques for the Minimization of Local Delay Variations

On the dependability of nanoscale circuits and systems

On the Reliability of Post-CMOS and SET Systems

Optimization of the Averaging Reliability Technique using Low Redundancy Factors for Nanoscale Technologies

Fault-Tolerance and Reliability of Post-CMOS Systems: a Circuit Perspective

Optimization of Nanoelectronic Systems Reliability under Massive Defect Density Using Distributed R-Fold Modular Redundancy

An Enhanced Service Provider Communication Interface with Client Priorization