Person

Chunmin Zhang

This person is no longer with EPFL

Related publications (25)

About
Privacy
Disclaimer

Graph Chatbot

Chat with Graph Search

Ask any question about EPFL courses, lectures, exercises, research, news, etc. or try the example questions below.

DISCLAIMER: The Graph Chatbot is not programmed to provide explicit or categorical answers to your questions. Rather, it transforms your questions into API requests that are distributed across the various IT services officially administered by EPFL. Its purpose is solely to collect and recommend relevant references to content that you can explore to help you answer your questions.

Chunmin Zhang

Graph Chatbot

Chat with Graph Search

Characterization and Modeling of Gigarad-TID-Induced Drain Leakage Current of 28-nm Bulk MOSFETs

Time Domain Near-Infrared Optical Tomography with Time-of-Flight SPAD Camera: The New Generation

A Novel 32 x 32, 224 Mevents/s Time Resolved SPAD Image Sensor for Near-Infrared Optical Tomography

Charge-Based Modeling of Radiation Damage in Symmetric Double-Gate MOSFETs

Bias Dependence of Total Ionizing Dose Effects on 28-nm Bulk MOSFETs

Mobility Degradation of 28-nm Bulk MOSFETs Irradiated to Ultrahigh Total Ionizing Doses

Total ionizing dose effects on a 28 nm Hi-K metal-gate CMOS technology up to 1 Grad

Characterization of GigaRad Total Ionizing Dose and Annealing Effects on 28-nm Bulk MOSFETs

Column-Parallel Dynamic TDC Reallocation in SPAD Sensor Module Fabricated in 180nm CMOS for Near Infrared Optical Tomography

Total Ionizing Dose Effects on Analog Performance of 28 nm Bulk MOSFETs