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Design and Realization of a Fault-Tolerant 90nm Cryptographic Engine Capable of Performing under Massive Defect Density

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Design and Realization of a Fault-Tolerant 90nm Cryptographic Engine Capable of Performing under Massive Defect Density

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Copper / low-k technological platform for the fabrication of high quality factor above-IC passive devices

Case Study of Fault-Tolerant Architectures for 90nm CMOS Cryptographic Cores

Full wafer integration of NEMS on CMOS by nanostencil lithography

Full wafer integration of NEMS on CMOS by nanostencil lithography

A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on A-Priori Functional Fault-Tolerance Analysis

Analysis of Reliability in Nano-Scale Circuits and Systems Based on A-Priori Statistical Fault-Modeling Methodology

Integrated fluxgate compass for portable applications

Single core fully integrated CMOS micro-fluxgate magnetometer

Modeling techniques and verification methodologies for substrate coupling effects in mixed-signal system-on-chip designs

First fully integrated 2-D array of single-photon detectors in standard CMOS technology

Integrated fluxgate compass for portable applications

Copper / low-k technological platform for the fabrication of high quality factor above-IC passive devices

Full wafer integration of NEMS on CMOS by nanostencil lithography

Full wafer integration of NEMS on CMOS by nanostencil lithography

Modeling techniques and verification methodologies for substrate coupling effects in mixed-signal system-on-chip designs

Case Study of Fault-Tolerant Architectures for 90nm CMOS Cryptographic Cores

Analysis of Reliability in Nano-Scale Circuits and Systems Based on A-Priori Statistical Fault-Modeling Methodology

First fully integrated 2-D array of single-photon detectors in standard CMOS technology

A Methodology for Reliability Enhancement of Nanometer-Scale Digital Systems Based on A-Priori Functional Fault-Tolerance Analysis

Single core fully integrated CMOS micro-fluxgate magnetometer