Stress–strain curveIn engineering and materials science, a stress–strain curve for a material gives the relationship between stress and strain. It is obtained by gradually applying load to a test coupon and measuring the deformation, from which the stress and strain can be determined (see tensile testing). These curves reveal many of the properties of a material, such as the Young's modulus, the yield strength and the ultimate tensile strength. Generally speaking, curves representing the relationship between stress and strain in any form of deformation can be regarded as stress–strain curves.
Dennard scalingIn semiconductor electronics, Dennard scaling, also known as MOSFET scaling, is a scaling law which states roughly that, as transistors get smaller, their power density stays constant, so that the power use stays in proportion with area; both voltage and current scale (downward) with length. The law, originally formulated for MOSFETs, is based on a 1974 paper co-authored by Robert H. Dennard, after whom it is named. Dennard's model of MOSFET scaling implies that, with every technology generation: Transistor dimensions could be scaled by −30% (0.
Optical modulatorAn optical modulator is a device which is used to modulate a beam of light. The beam may be carried over free space, or propagated through an optical waveguide (optical fibre). Depending on the parameter of a light beam which is manipulated, modulators may be categorized into amplitude modulators, phase modulators, polarization modulators etc. Often the easiest way to obtain modulation of intensity of a light beam, is to modulate the current driving the light source, e.g. a laser diode.
