Publication

Preliminary radiation tests of 32 µm thick hydrogenated amorphous silicon films

Arvind Shah, Matthieu Despeisse
2005
Journal paper

Abstract

Preliminary radiation tests of hydrogenated amorphous silicon n-i-p photodiodes deposited on a coated glass substrate are presented in this paper. These tests have been performed using a 24 GeV proton beam. We report results on the fluence dependence of the diode dark current and of the signal induced by a proton spill. © 2005 Published by Elsevier B.V.

Official source

https://infoscience.epfl.ch/record/133943?ln=en

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Preliminary radiation tests of 32 µm thick hydrogenated amorphous silicon films

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