We demonstrate nanometer-level localization accuracy of a single fluorescent emitter in three dimensions. Our super resolution microscopy technique is based on spectral self-interference for axial localization and two-dimensional diffraction pattern analysis for lateral localization.
Edoardo Charbon, Claudio Bruschini, Arin Can Ülkü, Yichen Feng
Christoph Merten, Jatin Panwar
Julia Schmale, Ivo Fabio Beck, Alireza Moallemi, Margarida Teles Nogueira Rolo