Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer
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An intelligent pinhole for confocal microscopy consisting of four position controlled blades forming a rectangular aperture from 3x3μm to 500 x 500 μm was built. This aperture can be positioned without drift under computer control in a positioning range wi ...
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Scanning capacitance microscopy and electrostatic force microscopy have been used to characterize commercial semiconductor devices at various stages of the fabrication process. These methods, combined with conventional atomic force microscopy, allow to vis ...
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We demonstrate high resolution imaging with microfabricated, cantilevered probes, consisting of solid quartz tips on silicon levers. The tips are covered by a 60-nm thick layer of aluminium, which appears to be closed at the apex when investigated by trans ...
The friction force on a nanometer-sized tip sliding on a surface is related to the thermally activated hopping of the contact atoms on an effective atomic interaction potential. A general analytical expression relates the height of this potential and the h ...
High resolution infrared imaging of thin films and biological systems is one of the most challenging experimental problems in contemporary science and technology. In this work, we have for the first time successfully tested a novel high resolution approach ...
Optical near field microscope for use with different, including differential contrast, methods. Microscope has a near field illuminating light source probe (3) and a photo-detector for detection of light from the object (6). Said detector has electronics f ...
Within the last 2 years our consortium has developed, built and tested an atomic force microscope for planetary science applications, in particular for the study of Martian dust and soil. An array of eight cantilevers and tips provides redundancy in case o ...